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What are the requirements for planar measurement for image measuring instruments?

Release time:2023-12-14      Number of hits:594

What are the requirements for planar measurement for image measuring instruments? The image measuring instrument uses an image probe to capture images of workpieces, extracts coordinate points on the surface of various complex shaped workpieces through digital image processing technology, and then converts them into various geometric elements in the coordinate measurement space using coordinate transformation and data processing technology. Therefore, the image measuring instrument calculates the actual size, shape, and mutual position relationship of the measured workpiece.

Image measuring instrument

Measurement of the plane: The scanning of the image measuring instrument can provide more data points for evaluating shape errors and arranging workpieces, and the time required for the image measuring instrument is much less than traditional point-to-point methods. The result is an improvement in the accuracy of the image measurement instrument assembly, which can be reflected in the overall improvement of measurement accuracy.

Measurement of Holes: High speed scanning by an image measuring instrument means that a large number of data points can be obtained within a few seconds, making it possible for the image measuring instrument to provide a complete description of hole features, such as size, position, and shape, while ensuring high accuracy and repeatability. In addition, the image measuring instrument can also simulate the dimensions of plug gauges and ring gauges, providing reliable calculations for the large-diameter workpiece that the image measuring instrument is compatible with the hole.

Measurement of cylinders using image measuring instruments: By collecting a large number of data points at each measurement section, the image measuring instrument can more accurately determine the shape and axis of the cylinder, and can evaluate key dimensional shape features, such as maximum and minimum feature sizes, to support the fitting analysis of the image measuring instrument workpiece.